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A Partial Enhanced Scan Method for Path Delay Fault Testing
Won Gi Kim , Myung Gyun Kim , Sungho Kang , Gunhee Han The Transactions of the Korea Information Processing Society (1994 ~ 2000),
Vol. 7, No. 10, pp. 3226-3235,
Oct.
2000
10.3745/KIPSTE.2000.7.10.3226
10.3745/KIPSTE.2000.7.10.3226
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All publications of KTCCS is indexed in DOI, EBSCO, Google Scholar, Crossref, and CrossCheck.
KTCCS is also selected as the Journal for Accreditation by NRF (National Research Foundation of Korea).
